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Supervisory circuits in a mixed neutron and gamma radiation environment

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Zong, Yi and Franco Peláez, Francisco Javier and Hernández Cachero, Antonio and Agapito Serrano, Juan Andrés and Fernandes, Ana C. and Marques, José G. and Rodríguez-Ruiz, Miguel Ángel and Casas-Cubillos, Juan (2005) Supervisory circuits in a mixed neutron and gamma radiation environment. In Radiation Effects Data Workshop, 2005. IEEE, 11/07/2005-15/07/2005, Seattle (USA).

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Official URL: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1532679



Abstract

This paper describes the evolution of different commercial microprocessor supervisory circuits under neutron and gamma radiation. After the irradiation, the tested devices showed some interesting changes: an increase of supply current and the period of watchdog timer. It was also observed that threshold voltage hysteresis and the shift of TTL trigger level appeared in some devices.


Item Type:Conference or Workshop Item (Poster)
Additional Information:

© Copyright IEEE
DOI: 10.1109/REDW.2005.1532679
ISBN: 0-7803-9367-8

Uncontrolled Keywords:Gamma-ray effects; Hysteresis; Integrated circuit testing; Microprocessor chips; Neutron effects; Reference circuits; TTL trigger level shift; Microprocessor supervisory circuits; Mixed neutron-gamma radiation environment; Supply current increase; Threshold voltage hysteresis; Watchdog timer; Circuit testing;Clocks;Cryogenics;Field programmable gate arrays;Gamma rays;Inductors;Large Hadron Collider;Microprocessors;Neutrons;Threshold voltage
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Radioactivity
Sciences > Computer science > Electronics
ID Code:28905
Deposited On:02 Mar 2015 13:19
Last Modified:10 Dec 2018 14:58

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