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Supervisory circuits in a mixed neutron and gamma radiation environment

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Zong, Yi y Franco Peláez, Francisco Javier y Hernández Cachero, Antonio y Agapito Serrano, Juan Andrés y Fernandes, Ana C. y Marques, José G. y Rodríguez-Ruiz, Miguel Ángel y Casas-Cubillos, Juan (2005) Supervisory circuits in a mixed neutron and gamma radiation environment. In Radiation Effects Data Workshop, 2005. IEEE, 11/07/2005-15/07/2005, Seattle (USA).

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URL Oficial: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1532679



Resumen

This paper describes the evolution of different commercial microprocessor supervisory circuits under neutron and gamma radiation. After the irradiation, the tested devices showed some interesting changes: an increase of supply current and the period of watchdog timer. It was also observed that threshold voltage hysteresis and the shift of TTL trigger level appeared in some devices.


Tipo de documento:Ponencia o Póster de Seminario, Congreso,etc (Póster)
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© Copyright IEEE
DOI: 10.1109/REDW.2005.1532679
ISBN: 0-7803-9367-8

Palabras clave:Gamma-ray effects; Hysteresis; Integrated circuit testing; Microprocessor chips; Neutron effects; Reference circuits; TTL trigger level shift; Microprocessor supervisory circuits; Mixed neutron-gamma radiation environment; Supply current increase; Threshold voltage hysteresis; Watchdog timer; Circuit testing;Clocks;Cryogenics;Field programmable gate arrays;Gamma rays;Inductors;Large Hadron Collider;Microprocessors;Neutrons;Threshold voltage
Materias:Ciencias > Física > Electrónica
Ciencias > Física > Radiactividad
Ciencias > Informática > Electrónica
Código ID:28905
Depositado:02 Mar 2015 13:19
Última Modificación:03 Mar 2015 13:00

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