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Using optimization techniques to characterize irradiated CMOS analog switches

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Zong, Yi y Franco Peláez, Francisco Javier y Agapito Serrano, Juan Andrés (2004) Using optimization techniques to characterize irradiated CMOS analog switches. In Radiation Effects on Components and Systems: RADECS, 2004: Proceedings: 5th RADESC Workshop, Madrid (Spain), 22-24 September 2004. INTA, Madrid, pp. 279-285. ISBN 84-930056-1-4

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Resumen

The use of mathematical optimization techniques allows estimating the degradation of the internal components of irradiated CMOS analog switches from their nonlinear resistance and the value of leakage currents at different power supplies voltages.


Tipo de documento:Sección de libro
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Radiation Effects on Components and Systems (RADECS 2004) (5. 2004. Madrid)

This work was supported by the cooperation agreement K746/LHC between CERN & UCM, by the Spanish Research Agency CICYT (FPA2002-00912) and partially supported by Instituto Tecnológico e Nuclear of Portugal.

Palabras clave:Analog switches, COTS, Neutron effects, Optimization, TID effects.
Materias:Ciencias > Física > Electrónica
Ciencias > Física > Radiactividad
Código ID:29022
Depositado:20 Mar 2015 17:13
Última Modificación:20 Mar 2015 17:13

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