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The Selection of a radiation-tolerant DAC for the LHC (Part I: Bipolar technology)

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Franco Peláez, Francisco Javier y Lozano Rogado, Jesús y Agapito Serrano, Juan Andrés (2003) The Selection of a radiation-tolerant DAC for the LHC (Part I: Bipolar technology). In 4ª Conferencia de Dispositivos Electrónicos, CDE 2003 [Recurso electrónico] : Calella de la Costa, Barcelona, 12 a 14 de febrero de 2003: libro de comunicaciones. Instituto de Microelectrónica de Barcelona CNM-CSIC, Bellaterra, V-14. ISBN 84-607-6770-1

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Resumen

The control system electronic of the LHC cold mass will require the use of 12-bit parallel input data converters and they must tolerate the radiation that will be generated by the particle beam. In this paper, we show the radiation tests on some DAC’s built in bipolar technology. During the irradiation, the offset & gain error and the relative number of bits were on-line measured. A brief description of the measuring system will be shown. After the deactivation of radioactive isotopes, the consumption and the frequency behaviour were checked. All these data were used to select the DAC which will be employed in the control of the LHC cold mass.

In the next paper, the results when testing CMOS converters will be shown.

Resumen (otros idiomas)

Tipo de documento:Sección de libro
Información Adicional:

Conferencia de Dispositivos Electrónicos (CDE 2003) (4. 2003. Calella de la Costa, España).
Spanish Conference on Electron Devices.

Palabras clave:COTS, Digital-to-analog converters, Radiation tolerance, Fast bipolar device, LHC.
Materias:Ciencias > Física > Electrónica
Ciencias > Física > Radiactividad
Ciencias > Informática > Circuitos integrados
Código ID:29033
Depositado:20 Mar 2015 18:37
Última Modificación:20 Mar 2015 18:55

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