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The Selection of a radiation-tolerant DAC for the LHC (Part II: CMOS technology)

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Franco Peláez, Francisco Javier y Lozano Rogado, Jesús y Agapito Serrano, Juan Andrés (2003) The Selection of a radiation-tolerant DAC for the LHC (Part II: CMOS technology). In 4ª Conferencia de Dispositivos Electrónicos, CDE 2003 [Recurso electrónico] : Calella de la Costa, Barcelona, 12 a 14 de febrero de 2003: libro de comunicaciones. Instituto de Microelectrónica de Barcelona CNM-CSIC, Bellaterra, V-15. ISBN 84-607-6770-1

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Total dose & neutron tests on commercial CMOS digital-to-analog converters have been carried out. These results are related to those ones presented in the previous paper. This kind of devices is much more sensitive to ionizing radiation than to neutrons. That radiation changes the value of the MOSFET threshold voltage and this can put digital circuits out of action. In this case, the gradual destruction of the digital inputs was observed as a diminution of the output voltage levels. Also, the gamma radiation generates leakage currents that increase the consumption. Due to these converters tolerated less total radiation dose, their use in the LHC has been refused and the fast bipolar technology converters will be employed.

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Tipo de documento:Sección de libro
Información Adicional:

Conferencia de Dispositivos Electrónicos (CDE 2003) (4. 2003. Calella de la Costa, España).
Spanish Conference on Electron Devices.

Palabras clave:COTS, Digital-to-analog converters, Radiation tolerance, CMOS technology, LHC.
Materias:Ciencias > Física > Electrónica
Ciencias > Física > Radiactividad
Ciencias > Informática > Circuitos integrados
Código ID:29034
Depositado:20 Mar 2015 18:54
Última Modificación:20 Mar 2015 18:54

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