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Degradation of instrumentation amplifiers due to the nonionizing energy loss damage

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Franco Peláez, Francisco Javier y Lozano Rogado, Jesús y Santos Blanco, José Pedro y Agapito Serrano, Juan Andrés (2003) Degradation of instrumentation amplifiers due to the nonionizing energy loss damage. IEEE Transactions on Nuclear Science, 50 (6). pp. 2433-2440. ISSN 0018-9499

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URL Oficial: http://dx.doi.org/10.1109/TNS.2003.820628


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Resumen

Tests on instrumentation amplifiers exposed to neutron radiation have been done. The tested devices were commercial instrumentation amplifiers or designed with rad-tol commercial operational amplifiers. The results show changes in frequency behavior, gain, offset voltage, output saturation voltages, and quiescent current. The radiation tolerance is bigger in amplifiers with JFET input stage or with large frequency bandwidth and is smaller if the amplifier has been designed for reducing the power consumption. The IAs built with OPAMPs have a higher tolerance than the commercial ones, but they have disadvantages: high temperature influence, low CMRR, etc.

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© IEEE TNS

Palabras clave:Amplification; Instrumentation amplifiers; Junction gate field effect transistors; Neutron effects; Nuclear electronics;nuclear instrumentation;operational amplifiers;COTS;JFET input stage;displacement damage;frequency behavior;gain;high temperature influence;instrumentation amplifiers degradation;large frequency bandwidth;low CMRR;neutron radiation;neutron tolerance;nonionizing energy loss damage tests;offset voltage;output saturation voltages;power consumption;quiescent current;rad-tol commercial operational amplifiers;radiation tolerance;Bandwidth;Degradation;Energy loss;Frequency;Instruments;Neutrons;Operational amplifiers;Power amplifiers;Testing;Voltage
Materias:Ciencias > Física > Electrónica
Ciencias > Física > Radiactividad
Código ID:29101
Depositado:09 Mar 2015 14:15
Última Modificación:06 Oct 2015 17:15

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