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Degradation of instrumentation amplifiers due to the nonionizing energy loss damage

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Franco Peláez, Francisco Javier and Lozano Rogado, Jesús and Santos Blanco, José Pedro and Agapito Serrano, Juan Andrés (2003) Degradation of instrumentation amplifiers due to the nonionizing energy loss damage. IEEE Transactions on Nuclear Science, 50 (6). pp. 2433-2440. ISSN 0018-9499

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Official URL: http://dx.doi.org/10.1109/TNS.2003.820628


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Abstract

Tests on instrumentation amplifiers exposed to neutron radiation have been done. The tested devices were commercial instrumentation amplifiers or designed with rad-tol commercial operational amplifiers. The results show changes in frequency behavior, gain, offset voltage, output saturation voltages, and quiescent current. The radiation tolerance is bigger in amplifiers with JFET input stage or with large frequency bandwidth and is smaller if the amplifier has been designed for reducing the power consumption. The IAs built with OPAMPs have a higher tolerance than the commercial ones, but they have disadvantages: high temperature influence, low CMRR, etc.

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© IEEE TNS

Uncontrolled Keywords:Amplification; Instrumentation amplifiers; Junction gate field effect transistors; Neutron effects; Nuclear electronics;nuclear instrumentation;operational amplifiers;COTS;JFET input stage;displacement damage;frequency behavior;gain;high temperature influence;instrumentation amplifiers degradation;large frequency bandwidth;low CMRR;neutron radiation;neutron tolerance;nonionizing energy loss damage tests;offset voltage;output saturation voltages;power consumption;quiescent current;rad-tol commercial operational amplifiers;radiation tolerance;Bandwidth;Degradation;Energy loss;Frequency;Instruments;Neutrons;Operational amplifiers;Power amplifiers;Testing;Voltage
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Radioactivity
ID Code:29101
Deposited On:09 Mar 2015 14:15
Last Modified:10 Dec 2018 14:58

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