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Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices

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López Calle, Isabel and Franco Peláez, Francisco Javier and Agapito Serrano, Juan Andrés and González Izquierdo, Jesús (2011) Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices. In 2011 Spanish Conference on Electron Devices (CDE 2011). Spanish Conference on Electron Devices . IEEE-Inst Electrical Electronics Engineers Inc, pp. 1-4. ISBN 978-1-4244-7863-7

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Official URL: http://dx.doi.org/10.1109/SCED.2011.5744202


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Abstract

One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to dangerous situations as it has been observed in some spatial missions. This paper shows how the value of the resistor loading the device can affect the shape of the transients.

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Item Type:Book Section
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© IEEE.
Spanish Conference on Electron Devices (CDE) (8.2011. Palma de Mallorca, España)

Uncontrolled Keywords:Analogue circuits; Circuit reliability; Resistors; Transients; Analog electronic devices; Analog electronic systems reliability; Energetic ions; Load resistor; Network loading; Single-event transients; Spatial missions; Spurious transients; Worst-case parameter; Operational amplifiers; Resistors; SPICE; Shape; Transient analysis; Transistors; Voltage measurement; Analog devices; Bipolar technology; Laser tests; Single event transients; System reliability; Two-photon absorption
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Optics
Sciences > Computer science > Integrated circuits
ID Code:29155
Deposited On:11 Mar 2015 19:03
Last Modified:10 Dec 2018 14:58

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