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Effect of photodiode angular response on surface plasmon resonance measurements in the Kretschmann-Raether configuration

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Gálvez Alonso, Fernando y Monton, C. y Serrano, A., A. y Valmianski, I. y De la Venta, J. y Schuller, Ivan K. y Garcia, M. A. (2012) Effect of photodiode angular response on surface plasmon resonance measurements in the Kretschmann-Raether configuration. Review of scientific instruments, 83 (9). ISSN 0034-6748

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URL Oficial: http://dx.doi.org/10.1063/1.4748521


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We study the effect of photodiode angular response on the measurement of surface plasmon resonance (SPR) in metallic thin films using the Kretschmann-Raether configuration. The photodiode signal depends not only on the light intensity but also on the incidence angle. This mplies that the photodiode sensitivity changes along the SPR curve. Consequently, the measured SPR spectrum is distorted, thus affecting fits and numerical analyses of SPR curves. We analyze the magnitude of this change, determine when it is significant, and develop a calibration method of the experimental setup which corrects for this type of spectral shape distortions.


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© 2012 American Institute of Physics.
Alberto Gil and Carlos Alonso are acknowledged by technical help with the experimental setup. This work was supported by CSIC (project I-LINK0400) and the Spanish Ministry of Science and innovation through the project FIS-2008-06249, Comunidad de Madrid, project NANOBIOMAGNET (S2009/MAT-1726) and AFOSR Project No. FA 9550-10-1-0409. J. de la Venta acknowledges the support of a postdoctoral fellowship from Ministry for Education of Spain.

Palabras clave:Optical-Constants; Films; Metals
Materias:Ciencias > Física > Física de materiales
Ciencias > Física > Física del estado sólido
Código ID:43055
Depositado:13 Jun 2017 15:50
Última Modificación:14 Jun 2017 07:40

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