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Number of items: 7.

Álvarez Herrero, Alberto and López Heredero, Raquel and Levy, David and Bernabeu Martínez, Eusebio (2001) Adsorption of water on porous Vycor glass studied by ellipsometry. Applied Optics, 40 (4). pp. 527-532. ISSN 1559-128X

Álvarez Herrero, Alberto and Guerrero Padrón, Héctor and Levy, David and Bernabeu Martínez, Eusebio (2002) Analysis of nanostructured porous films by measurement of adsorption isotherms with optical fiber and ellipsometry. Applied Optics, 41 (31). pp. 6692-7701. ISSN 1559-128X

Álvarez Herrero, Alberto (2004) Caracterización elipsométrica de materiales dieléctricos de aplicación en el desarrollo de sensores evanescentes de fibra óptica para el sector aeroespacial. [Thesis]

Rodriguez Schwendtner, Eva María and Álvarez Herrero, Alberto and Mariscal Jiménez, Antonio and Serna Galán, Rosalía and González Cano, Agustín and Navarrete Fernández, María Cruz and Díaz Herrera, Natalia (2019) Ellipsometric characterization of Bi and Al2O3 coatings for plasmon excitation in an optical fiber sensor. Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 37 (6). 062914. ISSN 2166-2746

Quiroga Mellado, Juan Antonio and Uribe Patarroyo, Néstor R. and Vargas, Javier and Álvarez Herrero, Alberto and Belenguer Dávila, Tomás (2010) Optical inspection of liquid crystal variable retarder inhomogeneities. Applied Optics, 49 (4). pp. 568-574. ISSN 1559-128X

Quiroga Mellado, Juan Antonio and Vargas, Javier and Álvarez Herrero, Alberto and Belenguer Dávila, Tomás (2011) Phase-shifting interferometry based on induced vibrations. Optics Express, 19 (2). pp. 584-596. ISSN 1094-4087

Álvarez Herrero, Alberto and Ramos Zapata, Gonzalo and Monte Muñoz de la Peña, Francisco del and Levy, David and Bernabeu Martínez, Eusebio (2004) Water adsorption in porous TiO_2–SiO_2 sol–gel films analyzed by spectroscopic ellipsometry. Thin Solid Films, 455 . pp. 356-360. ISSN 0040-6090

This list was generated on Wed Jun 3 00:23:34 2020 CEST.