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Number of items: 3.

Álvarez Herrero, Alberto (2004) Caracterización elipsométrica de materiales dieléctricos de aplicación en el desarrollo de sensores evanescentes de fibra óptica para el sector aeroespacial. Tesis PhD.

Quiroga Mellado, Juan Antonio and Uribe Patarroyo, Néstor R. and Vargas, Javier and Álvarez Herrero, Alberto and Belenguer Dávila, Tomás (2010) Optical inspection of liquid crystal variable retarder inhomogeneities. Applied Optics, 49 (4). pp. 568-574. ISSN 1559-128X

Quiroga Mellado, Juan Antonio and Vargas, Javier and Álvarez Herrero, Alberto and Belenguer Dávila, Tomás (2011) Phase-shifting interferometry based on induced vibrations. Optics Express, 19 (2). pp. 584-596. ISSN 1094-4087

This list was generated on Fri Apr 18 02:25:07 2014 CEST.