Universidad Complutense de Madrid
E-Prints Complutense

IndexAuthor

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Number of items: 12.

Fabero Jiménez, Juan Carlos and Mendías Cuadros, José Manuel and Mecha López, Hortensia and González Calvo, Carlos and Clemente Barreira, Juan Antonio (2015) Diseño y desarrollo de una placa de periféricos no convencionales para incentivar el aprendizaje autónomo sobre sistemas empotrados basados en FPGA y SoC ARM. [Proyecto de Innovación Docente]

Serrano, Felipe and Clemente Barreira, Juan Antonio and Mecha López, Hortensia (2015) A Methodology to Emulate Single Event Upsets in Flip-Flops using FPGAs through Partial Reconfiguration and Instrumentation. IEEE Transactions on Nuclear Science, 62 (4). pp. 1617-1624. ISSN 0018-9499

Serrano, Felipe and Clemente Barreira, Juan Antonio and Mecha López, Hortensia (2014) A Study of the Robustness Against SEUs of Digital Circuits Implemented with FPGA DSPs. In Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on, 23-27 Sept. 2013.

Clemente Barreira, Juan Antonio and Mansour, Wassim and Ayoubi, Rafic and Serrano, Felipe and Mecha López, Hortensia and Ziade, Haissam and El Falou, Wassim and Velazco, Raoul (2016) Hardware Implementation of a Fault-Tolerant Hopfield Neural Network on FPGAs. Neurocomputing, 171 . pp. 1606-1609. ISSN 0925-2312

Franco Peláez, Francisco Javier and Clemente Barreira, Juan Antonio and Mecha López, Hortensia and Velazco, Raoul (2019) Influence of Randomness during the Interpretation of Results from Single-Event Experiments on SRAMs. IEEE Transactions on device and materials reliability, 19 (1). pp. 104-111. ISSN 1530-4388

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Vila, Francesca and Baylac, Maud and Ramos Vargas, Pablo Francisco and Vargas Vallejo, Vanessa Carolina and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Velazco, Raoul (2015) Neutron-Induced single events in a COTS soft-error free SRAM at low bias voltage. In 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2015. IEEE-Inst Electrical Electronics Engineers Inc, pp. 162-165. ISBN 978-1-5090-0232-0

Clemente Barreira, Juan Antonio and Hubert, Guillaume and Franco Peláez, Francisco Javier and Vila, Francesca and Baylac, Maud and Puchner, Helmut and Velazco, Raoul and Mecha López, Hortensia (2017) Sensitivity Characterization of a COTS 90-nm SRAM at Ultra Low Bias Voltage. IEEE transactions on nuclear science, 64 (8). pp. 2188-2195. ISSN 0018-9499

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Baylac, Maud and Ramos Vargas, Pablo Francisco and Vargas Vallejo, Vanessa Carolina and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Velazco, Raoul (2016) Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Induced by 15-MeV Neutrons. IEEE Transactions on Nuclear Science, 63 (4). pp. 2072-2079. ISSN 0018-9499

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Baylac, Maud and Rey, Solenne and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2016) Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs. IEEE Transactions on Nuclear Science, 63 (4). pp. 2087-2094. ISSN 0018-9499

Franco Peláez, Francisco Javier and Clemente Barreira, Juan Antonio and Baylac, Maud and Rey, Solenne and Villa, Francesca and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2017) Statistical Deviations from the Theoretical only-SBU Model to Estimate MCU rates in SRAMs. IEEE Transactions on Nuclear Science, 64 (8). pp. 2152-2160. ISSN 0018-9499

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Rey, Sole and Baylac, Maud and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2015) Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs. In 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2015. IEEE-Inst Electrical Electronics Engineers Inc, pp. 507-510. ISBN 978-1-5090-0232-0

Mecha López, Hortensia (2002) Técnica de estimación de características físicas en síntesis de alto nivel. [Thesis]

This list was generated on Sun Dec 8 04:56:26 2019 CET.