Universidad Complutense de Madrid
E-Prints Complutense

IndexAuthor

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Number of items: 5.

Clemente, Juan Antonio and Hubert, Guilaume and Fraire, Juan and Franco Peláez, Francisco Javier and Villa, Francesca and Rey, Solenne and Baylac, Maud and Puchner, Helmut and Mecha, Hortensia and Velazco, Raoul (2018) SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2 MeV Neutrons. IEEE transactions on nuclear science (99). pp. 1-8. ISSN 0018-9499 (In Press)

Clemente Barreira, Juan Antonio and Hubert, Guillaume and Franco Peláez, Francisco Javier and Vila, Francesca and Baylac, Maud and Puchner, Helmut and Velazco, Raoul and Mecha López, Hortensia (2017) Sensitivity Characterization of a COTS 90-nm SRAM at Ultra Low Bias Voltage. IEEE transactions on nuclear science, 64 (8). pp. 2188-2195. ISSN 0018-9499

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Baylac, Maud and Rey, Solenne and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2016) Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs. IEEE Transactions on Nuclear Science, 63 (4). pp. 2087-2094. ISSN 0018-9499

Franco Peláez, Francisco Javier and Clemente Barreira, Juan Antonio and Baylac, Maud and Rey, Solenne and Villa, Francesca and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2017) Statistical Deviations from the Theoretical only-SBU Model to Estimate MCU rates in SRAMs. IEEE Transactions on Nuclear Science, 64 (8). pp. 2152-2160. ISSN 0018-9499

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Rey, Sole and Baylac, Maud and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2015) Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs. In 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2015. IEEE-Inst Electrical Electronics Engineers Inc, pp. 507-510. ISBN 978-1-5090-0232-0

This list was generated on Tue Jul 23 01:13:45 2019 CEST.