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Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Rey, Sole and Baylac, Maud and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2015) Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs. In 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2015. IEEE-Inst Electrical Electronics Engineers Inc, pp. 507-510. ISBN 978-1-5090-0232-0

This list was generated on Sun Sep 15 14:32:54 2019 CEST.