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The phase space analyzer with Gaussian slits

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Serna Galán, Julio and Nemes, George (2002) The phase space analyzer with Gaussian slits. In Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop On Laser Beam And Optics Characterization. Spie-Int Soc Optical Engineering, pp. 669-676.

Official URL: http://dx.doi.org/10.1117/12.472381




Abstract

The phase space analyzer is an optical device that uses slits, lenses and an irradiance-calibrated image detector in order to characterize optical beams. With such a device it is possible to obtain the beam power distribution along the two-dimensional phase space coordinates corresponding to a given transverse direction. The usual setup includes hard edge slits, and it has been considered in previous studies to measure stigmatic and simple astigmatic beams. We analyze a phase space analyzer with Gaussian slits to measure Gauss Schell-model beams. Special attention is given to general astigmatic beams (such as twisted irradiance and/or twisted phase beams), where a characterization along two orthogonal transverse axes is not enough.


Item Type:Book Section
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© (2003) SPIE--The International Society for Optical Engineering. Annual Boulder Damage Symposium on Optical Materials for High-Power Lasers (34ª. 2002. Boulder, Colorado, EE.UU.) / International Workshop on Laser Beam and Optics Characterization (7º. 2002. Boulder, Colorado, EE.UU.)

Uncontrolled Keywords:Materials Science, Characterization and Testing, Materials Science, Coatings and Films, Optics, Physics, Condensed Matter
Subjects:Sciences > Physics > Optics
ID Code:21405
Deposited On:02 Jul 2013 09:04
Last Modified:02 Jul 2013 09:04

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