Universidad Complutense de Madrid
E-Prints Complutense

Efectos de radiaciones en circuitos integrados digitales: orígenes, técnicas de mitigación y tests experimentales

Impacto

Downloads

Downloads per month over past year



Velazco, Raoul (2013) Efectos de radiaciones en circuitos integrados digitales: orígenes, técnicas de mitigación y tests experimentales. In Ciclo de conferencias del Máster en Investigación en Informática, 18 de junio de 2013, Sala de Grados de la Facultad de Informática de la Universidad Complutense de Madrid. (Submitted)

Official URL: http://complumedia.ucm.es/resultados.php?contenido=OA-NKVvlPLlKo_K8X5g9sg==



Abstract

This work presents an approach to predict the error rate due to Single Event Upsets (SEU), which are errors changing de content of memory cells, occurring in programmable circuits as the consequence of the impact of an energetic particle (heavy ion, proton, neutron,...) present in the environment where the circuits operates (space, earth's atmosphere, nuclear plants,...). For a chosen application, the error-rate is predicted by combining the DUT (Device Under Test) static SEU cross-section obtained from experiments performed in particle accelerators, and the results of fault injection campaigns performed off-beam during which huge number of SEUs are injected during the execution of the studied application. This methodology will be illustrated for a processor and a SRAM-based FPGA


Item Type:Conference or Workshop Item (Other)
Additional Information:

Ciclo de conferencias del Máster en Investigación en Informática , coordinado por Narciso Martí Oliet

Uncontrolled Keywords:Radiación, Circuitos integrados digitales, Efectos de la radiación, Digital integrated circuits,Effect of radiation on, Radiation
Subjects:Sciences > Physics > Radioactivity
Sciences > Computer science > Integrated circuits
ID Code:22662
Deposited On:08 Aug 2013 10:42
Last Modified:08 Aug 2013 11:38

Origin of downloads

Repository Staff Only: item control page