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Study of the defects in sintered SnO_2 by high-resolution transmission electron microscopy and cathodoluminescence

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Maestre Varea, David and Ramirez Castellanos, Julio and Hidalgo Alcalde, Pedro and Cremades Rodríguez, Ana Isabel and Gónzalez Calbet, J.M. and Piqueras de Noriega, Javier (2007) Study of the defects in sintered SnO_2 by high-resolution transmission electron microscopy and cathodoluminescence. European Journal of Inorganic Chemistry (11). pp. 1544-1548. ISSN 1434-1948

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Official URL: http://onlinelibrary.wiley.com/doi/10.1002/ejic.200600990/full


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Abstract

The defect structure of sintered SnO_2 was investigated by high-resolution transmission electron microscopy (HRTEM), cathodoluminescence (CL), and electrical measurements. HRTEM shows the presence of the SnO phase in the sintered samples as well as twinning, stacking faults, and disordered intergrowths. The sintered samples annealed under an oxygen atmosphere show changes in the defect structure and in the CL spectra. In particular, the intensity of a CL band at 1.94 eV, related to oxygen vacancies, decreased as the electrical resistivity increased. The results are discussed by considering the presence of stoichiometric defects such as oxygen vacancies and Sn interstitials in the final structure and their evolution during the annealing process under an oxygen atmosphere.


Item Type:Article
Additional Information:

© Wiley-VCH Verlag GmbH & Co. KGaA, 69451 Weinheim,
Germany, 2007.
This work was supported by MEC (project MAT 2003-00455) and
by UCM-CM (Group 910146).

Uncontrolled Keywords:Transparent Conducting Oxide, Thin-Films, Tin Dioxide, Oxygen, Interfaces, Surface, States
Subjects:Sciences > Physics > Materials
ID Code:23099
Deposited On:09 Oct 2013 18:21
Last Modified:09 May 2016 14:28

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