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Improvements in laser beam characterization with a CCD-based setup

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Quiroga Mellado, Juan Antonio and González Moreno, Ricardo and Alonso Fernández, José and Bernabeu Martínez, Eusebio (2004) Improvements in laser beam characterization with a CCD-based setup. In Photonics in Measurement. VDI Berichte (1844). VDI-VDE - Verlag GMBH, pp. 225-234. ISBN 3-18-091844-6



Abstract

CCD-based setups are widely extended in commercial beam profilers. In many beam-profiling applications the high sensitivity of CCD-camera makes necessary the attenuation of the beam. It can affect the beam profile and cause lost of information in regions of low irradiance. In this work we analyze the combined influence of noise and masking in the beam characterization, particularly in the measurement of second order moments. We also apply an extended intensity range imaging technique to improve the quality of the information obtained by a generic instrument. It is achieved merging several images with different sensitivities which are obtained with different integration times.


Item Type:Book Section
Additional Information:

© 2004 VDI-VDE-Verlag GMBH.
International Symposium on Photonics in Measurement (2º. 2004. Fráncfort, Alemania).

Uncontrolled Keywords:Instruments and Instrumentation, Optics
Subjects:Sciences > Physics > Optics
ID Code:23106
Deposited On:11 Oct 2013 18:52
Last Modified:14 Oct 2013 12:39

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