Universidad Complutense de Madrid
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Improvements in laser beam characterization with a CCD-based setup

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Quiroga Mellado, Juan Antonio y González Moreno, Ricardo y Alonso Fernández, José y Bernabeu Martínez, Eusebio (2004) Improvements in laser beam characterization with a CCD-based setup. In Photonics in Measurement. VDI Berichte (1844). VDI-VDE - Verlag GMBH, pp. 225-234. ISBN 3-18-091844-6



Resumen

CCD-based setups are widely extended in commercial beam profilers. In many beam-profiling applications the high sensitivity of CCD-camera makes necessary the attenuation of the beam. It can affect the beam profile and cause lost of information in regions of low irradiance. In this work we analyze the combined influence of noise and masking in the beam characterization, particularly in the measurement of second order moments. We also apply an extended intensity range imaging technique to improve the quality of the information obtained by a generic instrument. It is achieved merging several images with different sensitivities which are obtained with different integration times.


Tipo de documento:Sección de libro
Información Adicional:

© 2004 VDI-VDE-Verlag GMBH.
International Symposium on Photonics in Measurement (2º. 2004. Fráncfort, Alemania).

Palabras clave:Instruments and Instrumentation, Optics
Materias:Ciencias > Física > Optica
Código ID:23106
Depositado:11 Oct 2013 18:52
Última Modificación:14 Oct 2013 12:39

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