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Surface reconstruction of polycrystalline TiO_2 in oxygen atmosphere

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Plugaru, R. and Vasilco, R. and Piqueras de Noriega, Javier and Cremades Rodríguez, Ana Isabel (2003) Surface reconstruction of polycrystalline TiO_2 in oxygen atmosphere. In 2003 International Semiconductor Conference. IEEE, pp. 73-78. ISBN 0-7803-7821-0

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Abstract

Polyerystalline TiO2 surface reconstruction in oxygen atmosphere has been investigated by atomic force microscopy (AFM) and cathodoluminescence in the scanning electron microscopy (SEM-CL). The reactivity to oxygen is related to the presence of defects as interstitial Ti ions, that induce growth of protrusions, large terraces and polygonal shaped structures.


Item Type:Book Section
Additional Information:

International Semiconductor Conference (26.2003.Sinaia, Rumania).
This work was supported by MYCT (Project MAT2000-21I9). R.P acknowledge MYCT for a Iresearch. grant of NATO scientific program.

Uncontrolled Keywords:Scanning-Tunneling-Microscopy, Gas-Sensors, Tio_2(110), Visualization, Rutile, Oxide, Films, Stm
Subjects:Sciences > Physics > Materials
ID Code:23328
Deposited On:23 Oct 2013 17:17
Last Modified:13 Feb 2018 15:37

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