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Cathodoluminescence from nanocrystalline silicon films in the scanning electron microscope

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Méndez Martín, Bianchi and Piqueras de Noriega, Javier and Plugaru, R and Craciun, G. and Nastase, N. and Cremades Rodríguez, Ana Isabel and Nogales Díaz, Emilio (1998) Cathodoluminescence from nanocrystalline silicon films in the scanning electron microscope. Solided State phenomena, 63-4 . pp. 191-197. ISSN 1012-0394

Official URL: http://dx.doi.org/10.4028/www.scientific.net/SSP.63-64.191


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Abstract

Luminescence emission of nanocrystalline silicon films has been studied by cathodoluminescence (CL) in the scanning electron microscope. As deposited films show visible luminescence with dominant blue band as well as a red band. The evolution of CL bands after implantation and anodization treatments is investigated. Our results suggest that the dominant blue band has a complex character with a component at 400 nm which appears related to quantum size effects.


Item Type:Article
Uncontrolled Keywords:Porous Silicon, Luminescence, Dislocations, Defects, Si
Subjects:Sciences > Physics > Materials
ID Code:23591
Deposited On:21 Nov 2013 17:14
Last Modified:13 Feb 2018 14:48

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