Publication: Assessment of waveguiding properties of gallium oxide nanostructures by angle resolved cathodoluminescence in a scanning electron microscope
Loading...
Full text at PDC
Publication Date
2011-07
Authors
Advisors (or tutors)
Editors
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier Science BV
Citations
Exportar
Abstract
Cathodoluminescence (CL) of Ga2O3 nanowires and planar microstructures has been studied in a scanning electron microscope, as a function of the orientation angle of the structures relative to the position of the light detection system in the microscope chamber. CL contrast shows a marked dependence on the detection angle due to the waveguiding behaviour of the structures. The angle resolved cathodoluminescence (ARCL) measurements enable to evaluate the optical losses of guided blue-ultraviolet light in nanowires with diameters in the sub-wavelength range, deposited on graphite tape or silicon. In planar, branched feather-like microstructures, ARCL images demonstrate the directional-dependant light guiding behaviour of the nano-branches. (
Description
© 2011 ElsevierB.V.
This work has been supported by MEC (projects MAT2006- 01259, MAT2009-07882 and Consolider Ingenio CSD 2009-00013) and BSCH-UCM (Group 910146).
UCM subjects
Unesco subjects
Keywords
Citation
[1] L. Binet, D. Gourier, J. Phys. Chem. Solids 59 (1998) 1241.
[2] K.-W. Chang, J.-J. Wu, Adv. Mater. 16 (2004) 545.
[3] E. Nogales, B. Mé ndez, J. Piqueras, Appl. Phys. Lett. 86 (2005) 113112.
[4] E. Nogales, J.A. García, B. Méndez, J. Piqueras, Appl. Phys. Lett. 91 (2007) 133108.
[5] D.P. Yu, J.L. Bubendorff, J.F. Zhou, Y. Leprince-Wang, M. Troyon, Solid State Commun. 124 (2002) 417.
[6] S.I. Maximenko, L. Mazeina, Y.N. Picard, J.A. Freitas Jr., V.M. Bermudez, S.M. Prokes, Nano Lett. 9 (2009) 3245.
[7] M. Fleischer, J. Giber, H. Meixner, Appl. Phys. A 54 (1992) 560.
[8] Baban,Y.Toyoda,M.Ogita,ThinSolidFilms484(2005)369.
[9] M.Passlack,E.F.Schubert,W.S.Hobson,M.Hong,N.Moriya,S.N.G.Chu, K. Konstandinidis,J.P.Mannaerts,M.L.Schnoes,G.J.Zydzik,J.Appl.Phys.77 (1995) 686.
[10] E.Nogales,B.Me´ ndez, J.Piqueras,J.A.Garcı´a, Nanotechnology20(2009) 115201.
[11] P.Hidalgo,B.Mé ndez, J.Piqueras,Nanotechnology18(2007)155203.
[12] T.Tsuruoka,C.H.Liang,K.Teraba,T.Hasegawa,J.Opt.A:PureAppl.Opt.10 (2008) 055201.
[13] T.Voss,G.T.Svacha,E.Mazur,S.Müller, C.Ronning,D.Konjhodzic,F.Marlow, Nano Lett.7(2007)3675.
[14]M.Law,D.J.Sirbuly,J.C.Johnson,J.Goldberger,R.J.Saykally,P.Yang,Science 305 (2004)1269.
[15] C.Li,M.Gao,C.Ding,X.Zhang,L.Zhang,Q.Chen,L.M.Peng,Nanotechnology 20 (2009)175703.
[16] W.Li,M.Gao,R.Cheng,X.Zhang,S.Xie,L.M.Peng,Appl.Phys.Lett.93(2008) 023117.
[17] FeiWang,ZhanghuaHan,LiminTong,PhysicaE30(2005)150.
[18]C.J.Barrelet,A.B.Greytak,C.M.Lieber,NanoLett.4(2004)1981.
[19]K.A.Dick,K.Deppert,M.W.Larsson,T.Martensson,W.Seifert,W.R.Wallenberg, L.Samuelson,Nat.Mater.3(2004)380.
[20] Y.Jung,D.-K.Ko,R.Agarwal,NanoLett.7(2007)264.