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Cathodoluminescence characterization of rare earth doped composite materials based on porous GaP

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Sánchez, B and Méndez Martín, Bianchi and Piqueras de Noriega, Javier and Sirbu, L. and Tiginyanu, I. and M., I. and Ursaki, V.V. (2008) Cathodoluminescence characterization of rare earth doped composite materials based on porous GaP. Journal of Materials Science, 43 (2). pp. 680-683. ISSN 0022-2461

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Official URL: http://link.springer.com/article/10.1007%2Fs10853-007-2163-z?LI=true


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Abstract

Porous GaP layers doped with erbium or europium elements have been obtained by electrochemical etching and further impregnation processes. The thermal treatments for optical activation of rare earth (RE) ions lead to partial oxidation of porous GaP skeleton and a composite material is obtained. The presence of ErPO_4 and EuPO_4 oxide nanophases is detected by X-ray diffraction (XRD) analysis. Visible luminescence from RE ions in the composite material has been investigated by means of the cathodoluminescence (CL) technique in the scanning electron microscope. Intense red and green emission lines characteristic from Er^3 and Eu^3 ions dominate the CL spectra in the case of parallel and regular nanotubes in the samples. The role of the oxygen content and the detected phases in the luminescence results are discussed.


Item Type:Article
Additional Information:

© Springer Science+Business Media, LLC 2007.
Meeting of the Brazilian-Society-for-Materials-Research (5. 2008. Florianopolis, Brasil).
This work has been supported by MEC (project MAT-2003-00455).

Uncontrolled Keywords:Semiconductors, Luminescence, Photoluminescence, Silicon
Subjects:Sciences > Physics > Materials
ID Code:24309
Deposited On:22 Jan 2014 17:50
Last Modified:13 Feb 2018 14:44

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