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Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques

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Miranda Pantoja, José Miguel and Muñoz San Martín, Sagrario and Sebastián Franco, José Luis (2001) Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques. In IEEE Instrumentation and Measurement Technology Conference. IEEE, Budapest, Hungary, pp. 530-533. ISBN 0-7803-6646-8

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Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=928875


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Abstract

This paper presents a procedure for an accurate characterization of parasitic effects of terminal pads in microwave devices. This procedure is based on the measurement of S and Noise parameters of the device with two different sets of calibration standards, and simplifies the process of extracting the parasitic elements of the small signal equivalent circuit.


Item Type:Book Section
Additional Information:

© IEEE. IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) (18.2001.Budapest, Hungria).

Uncontrolled Keywords:Signal.
Subjects:Sciences > Physics > Electricity
Sciences > Physics > Electronics
ID Code:24670
Deposited On:17 Mar 2014 11:33
Last Modified:10 Dec 2018 14:58

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