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A procedure for accurate noise measurements of one port devices with high reflection coefficients

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Miranda Pantoja, José Miguel and Sebastián Franco, José Luis (1994) A procedure for accurate noise measurements of one port devices with high reflection coefficients. In IEEE MTT-S International Microwave Symposium Digest. IEEE, San Diego, California, USA, pp. 1065-1067. ISBN 0-7803-1778-5

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Official URL: http://dx.doi.org/10.1109/MWSYM.1994.335171




Abstract

This work presents a procedure to reduce effectively the uncertainty of noise measurements of highly reflective one-port DUT's. This procedure consists of inserting an attenuator between the calibration reference plane and the DUT. The measurement RSS uncertainty has been calculated analytically and an excellent improvement of the accuracy and repeatability has been obtained when attenuations of moderate values were used.


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IEEE MTT-S International Microwave Symposium (1994. San Diego, California, USA). © 1994 IEEE. This work has partially been funded by the Erasmus Researcher Exchange Programme and the Secretaria General del Plan Nacional de I+D (project PTR91-0037). The experimental measurements were made at the Institut flir Hochfrequenztechnik, Technische Hochschule of Darmstadt, Germany.
Special acknowledgment to Professor Hans L. Hartnagel, who has facilitated the cooperation between the two Universities involved in this work, making many stimulating discussions possible.
The authors also wish to thank Jian-Min Miao and Rolf Riemenschneider for their assistance in the automation of the measurements. Finally, Dr. Luis Vkquez is acknowledged for all the administrative work.

Uncontrolled Keywords:Engineering, Electrical & Electronic, Optics, Telecommunications.
Subjects:Sciences > Physics > Electricity
Sciences > Physics > Electronics
ID Code:24771
Deposited On:20 Mar 2014 10:23
Last Modified:10 Dec 2018 14:58

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