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Accuracy of nonoscillating one-port noise measurements

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Miranda Pantoja, José Miguel y Sebastián Franco, José Luis (1995) Accuracy of nonoscillating one-port noise measurements. IEEE Transaction on instrumentation and measurement, 44 (4). pp. 853-859. ISSN 0018-9456

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URL Oficial: http://dx.doi.org/10.1109/19.392870


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This paper presents a detailed analysis of the accuracy of nonoscillating one-port device noise measurements. A new expression is given for the calculation of the noise temperature from parameters that can be measured directly by using either a power sensor or a noise meter with the capability of making power measurements. A general expression for the DUT noise temperature error function is also obtained, which enables the authors to study how the noise measurement accuracy is affected by a number of different factors. This expression has been found very useful in order to study how the accuracy can be improved in a given noise measurement system. The error function has been applied to evaluate the uncertainty of Schottky barrier device noise measurements.


Tipo de documento:Artículo
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© 1995 IEEE. This work was developed at the Institut fur Hochfrequenztechnik of Darmstadt. Special acknowledgment is given to Professor H. L. Hartnagel, who has facilitated the cooperation between the two Universities involved in this work, making many stimulating discussions possible. The authors also wish to thank J.-M. Miao and R. Riemenschneider for their assistance in the automation of the measurements, and J. D. Gallego for his valuable suggestions. Finally, Dr. L. Vázquez is acknowledged for all the administrative work.

Palabras clave:Schottky-Barrier Diodes, Fabrication, Design.
Materias:Ciencias > Física > Electricidad
Ciencias > Física > Electrónica
Código ID:24786
Depositado:24 Mar 2014 08:56
Última Modificación:23 Oct 2015 15:49

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