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Application of cathodoluminescence microscopy to the study of native acceptors in gallium antimonide

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Piqueras de Noriega, Javier and Méndez Martín, Bianchi and Panin, G. N. and Dutta, P. S. and Dieguez, E. (1996) Application of cathodoluminescence microscopy to the study of native acceptors in gallium antimonide. In CAS '96 Proceedings - 1996 International Semiconductor Conference. I E E E, pp. 497-506. ISBN 0-7803-3223-7

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Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=557426


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Abstract

Cathodoluminescence in the scanning electron microscope is used to ivestigate growth and prosess induced defects in GaSb crystals. In particular, luminescence emission has been used to study the nature of acceptor defects present after different annealing and irradiation treatments.


Item Type:Book Section
Additional Information:

© 1996 IEEE.
1996 International Semiconductor Conference (CAS 96) (1996.Sinaia, Romania)

Uncontrolled Keywords:Engineering, Electrical & Electronic
Subjects:Sciences > Physics > Materials
ID Code:24835
Deposited On:27 Mar 2014 19:24
Last Modified:27 Mar 2014 19:24

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