Publication: Application of cathodoluminescence microscopy to the study of native acceptors in gallium antimonide
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1996
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Abstract
Cathodoluminescence in the scanning electron microscope is used to ivestigate growth and prosess induced defects in GaSb crystals. In particular, luminescence emission has been used to study the nature of acceptor defects present after different annealing and irradiation treatments.
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© 1996 IEEE.
1996 International Semiconductor Conference (CAS 96) (1996.Sinaia, Romania)
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