Publication: Estudio de la incorporación de iones de Er y Nd en galio antimonio crecido por el método Bridgman
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Publication Date
2000-07
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Sociedad Española de Cerámica y Vidrio
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Abstract
En este trabajo se ha realizado el estudio de cristales de GaSb crecidos por el método Bridgman y dopados con Er y Nd con distintas concentraciones. Se han realizado análisis de absorción atómica pudiéndose obtener el coeficiente de segregación efectivo de ambos dopantes a lo largo de la dirección de crecimiento del material. Mediante medidas de efecto Hall se ha determinado el tipo de portadores mayoritarios (huecos) así como los valores de la movilidad, la densidad de portadores y la resistividad para cada una de las concentraciones. Los análisis de dispersión de energías de rayos X (EDAX) y de microscopio electrónico de barrido (SEM) han demostrado la presencia de agregados formados por los iones de tierras raras y Sb para las concentraciones de dopante más altas. La reducción de los defectos nativos tales como las vacantes de Ga y Ga en posición de Sb por los iones de Er ha sido también demostrado a través de análisis de catodoluminiscencia.
In this work the study of GaSb crystals grown by the Bridgman method doped with Er and Nd with different concentrations has been carried out. Atomic absorption analysis have been developed for obtaining the effective segregation coefficient of the two dopants along the growth direction of the material. The resistivity, mobility and density of carriers were obtained by the van der Pauw technique fur the different dopant concentrations. The Energy dispersive X ray analysis (EDX) and the scanning electron microscope (SEM) have demonstrated the presence of precipitates made from Sb and rare earth elements for the highest dopant concentrations. Cathodoluminescence (CL) analysis have proved that the rare earth elements have a reduction effect of native defects in GaSb.
In this work the study of GaSb crystals grown by the Bridgman method doped with Er and Nd with different concentrations has been carried out. Atomic absorption analysis have been developed for obtaining the effective segregation coefficient of the two dopants along the growth direction of the material. The resistivity, mobility and density of carriers were obtained by the van der Pauw technique fur the different dopant concentrations. The Energy dispersive X ray analysis (EDX) and the scanning electron microscope (SEM) have demonstrated the presence of precipitates made from Sb and rare earth elements for the highest dopant concentrations. Cathodoluminescence (CL) analysis have proved that the rare earth elements have a reduction effect of native defects in GaSb.
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(c) Sociedad Española de Cerámica y Vidrio, Consejo Superior de Investigaciones Científicas. Licencia Creative Commons 3.0 España (by-nc).
Este trabajo ha sido subvencionado por CICYT a través del proyecto ESP-98 1340.
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