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Edge image quality assessment: a new formulation for degraded edge imaging

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Manzanares Ituarte, Ana and Calvo Padilla, María Luisa and Chevalier dl Río, Margarita and Lakshminarayanan, Vasudevan (1998) Edge image quality assessment: a new formulation for degraded edge imaging. Image and Vision omputing, 16 (14). pp. 1003-1017. ISSN 0262-8856

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Official URL: http://www.sciencedirect.com/science/article/pii/S0262885698000729


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Abstract

We discuss a formalism to characterize degraded edge images formed in a diffraction limited system (with circular pupil of unit radius) under conditions of incoherent illumination. We introduce a novel definition of degraded edges and consider this approach to model a basic optical mechanism involved in the perception of visual depth and edge detection. We introduce a degradation parameter to quantize the degree of edge blur. We present a generalization of such a procedure by assuming the Heaviside function to be a systematic generator of degraded edges. We reproduce experimentally the predictions made by the formalism proposed herein.


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© 1998 Elsevier Science B.V.
Reunión Nacional de Óptica de la Sociedad Española de Óptica (SEDO) (1994. 4ª. Granada, España).
Congress of the International Commission for Optics (ICO) (17º. 1996. Daejon,Corea del Sur).
Optical Society of America (OSA)Annual Meeting (1997. Long Beach, California, EE.UU.).
Partial results of this work were presented at the IVth National Meeting of the Spanish Optical Society, SEDO, Granada, Spain, September 1994; the 17th Congress of the International Commission for Optics (ICO), Taejon, Korea, August 1996; and the Annual Meeting of the Optical Society of America, Long Beach, USA, October 1997. The financial support of the Spanish Ministry of Health, the Institute of Health ‘Carlos III’ and the Health Research Foundation, under project 95/1518, and project PR160/93- 4829/93 from the Rectorate of the Complutense University are acknowledged. We are indebted to Ivan Sanz Rodriguez for his collaboration. Also, Carmen Bravo gave us computational assistance at the Computing Center of the Complutense University of Madrid. We thank Professor J.M. Enoch for helpful suggestions.

Uncontrolled Keywords:Contrast Sensitivity, Perceptual Characterization, Model, Vision, Blur, Noise, Line, Detectors, Frequency, Acuity
Subjects:Sciences > Physics > Optics
ID Code:25638
Deposited On:09 Jun 2014 08:22
Last Modified:09 Jun 2014 08:22

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