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Scanning tunneling microscopy study of the surface electrical properties of ZnO films grown by pulsed laser deposition

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Urbieta, S. and Fernández Sánchez, Paloma and Piqueras de Noriega, Javier and Vasco, E. and Zaldo, C (2003) Scanning tunneling microscopy study of the surface electrical properties of ZnO films grown by pulsed laser deposition. Physica Status Solidi A-Applied Research, 195 (1). pp. 183-187. ISSN 0031-8965

Official URL: http://dx.doi.org/10.1002/pssa.200306275


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Abstract

Highly (001) textured ZnO films grown on (100)InP by pulsed laser deposition have been studied by Scanning Tunneling Microscopy (STM). Constant current images show a well defined grain structure, which allows to perform local spectroscopic studies. From differential conductance spectra an asymmetry of the electrical properties at both sides of the boundaries can be observed, which can be attributed to the formation of space charge layers. On the other hand the electrical behavior, in particular the conduction type, differs from grain to grain, likely due to the different orientation of the faces exposed to the STM tip.


Item Type:Article
Additional Information:

© Wiley-V C H Verlag Gmbh.
International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (EXMATEC 2002) (6. 2002. Budapest, Hungria).

Uncontrolled Keywords:Microcrystallite Thin-Films, Room-Temperature, Electronic-Structure, Si(111)2x1 Surface, Spectroscopy, Varistors
Subjects:Sciences > Physics > Materials
ID Code:26257
Deposited On:16 Jul 2014 10:12
Last Modified:16 Jul 2014 10:12

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