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Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope

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Díaz-Guerra Viejo, Carlos and Piqueras de Noriega, Javier (1999) Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope. Journal of Applied Physics, 86 (4). pp. 1874-1877. ISSN 0021-8979

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Official URL: http://dx.doi.org/10.1063/1.370982


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Abstract

A correlative study of the electrically active grain boundary structure of ZnO polycrystals has been carried out using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined instrument. Current imaging tunneling spectroscopy (CITS) measurements reveal reduced surface band gaps, as compared with grain interiors, at the charged boundaries imaged by SEM-based remote electron beam induced current (REBIC). ZnO grain boundaries were also imaged in the STM-REBIC mode with a resolution of up to 20 nm. The contrast differences observed in the SEM-REBIC and STM-REBIC images are discussed in terms of the different experimental conditions used in both techniques.


Item Type:Article
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© 1999 American Institute of Physics.
This work was supported by DGES through Project PB96-0639.

Uncontrolled Keywords:Electronic-Structure, Si(111)2x1 Surface, Grain-Boundaries
Subjects:Sciences > Physics > Materials
ID Code:26360
Deposited On:25 Jul 2014 12:29
Last Modified:25 Jul 2014 12:29

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