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Study of charged defects in CdTe and CdHgTe by scanning electron and tunneling microscopy techniques

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Panin, G. N. and Díaz-Guerra Viejo, Carlos and Piqueras de Noriega, Javier (1998) Study of charged defects in CdTe and CdHgTe by scanning electron and tunneling microscopy techniques. Izvestiya Akademii Nauk Seriya Fizicheskaya, 62 (3). pp. 461-466. ISSN 1026-3489





Item Type:Article
Uncontrolled Keywords:Si(111)2x1 Surface, Spectroscopy, Cathodoluminescence
Subjects:Sciences > Physics > Materials
ID Code:26377
Deposited On:29 Jul 2014 08:46
Last Modified:29 Jul 2014 08:46

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