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Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range

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Morlanes Calvo, Tomás and Peña, José Luis de la and Sánchez Brea, Luis Miguel and Alonso Fernández, José and Crespo Vázquez, Daniel and Saez Landete, José and Bernabeu Martínez, Eusebio (2005) Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range. In Materials, Devices, and Applications. Proceedings of Society of Photo-Optical Instrumentation Engineers (SPIE), 1-2 (5840). Society of Photo-Optical Instrumentation Engineers (SPIE), pp. 862-870. ISBN 0-8194-5835-X

Official URL: http://dx.doi.org/10.1117/12.628135




Abstract

In this work, an optoelectronic device that provides the absolute position of a measurement element with respect to a pattern scale upon switch-on is presented. That means that there is not a need to perform any kind of transversal displacement after the startup of the system. The optoelectronic device is based on the process of light propagation passing through a slit. A light source with a definite size guarantees the relation of distances between the different elements that constitute our system and allows getting a particular optical intensity profile that can be measured by an electronic post-processing device providing the absolute location of the system with a resolution of 1 micron. The accuracy of this measuring device is restricted to the same limitations of any incremental position optical encoder.


Item Type:Book Section
Additional Information:

© (2005) SPIE--The International Society for Optical Engineering.
Conference on Photonic Materials, Devices and Applications (2005. Sevilla, España)

Uncontrolled Keywords:LAU, Encoder
Subjects:Sciences > Physics > Optics
ID Code:26744
Deposited On:25 Sep 2014 10:45
Last Modified:25 Sep 2014 10:45

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