Publication: Comparison between optical techniques and confocal microscopy for defect detection on thin wires
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2004-11-15
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Elsevier Science B. V.
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Conventional microscopy techniques, such as atomic force microscopy (AFM), scanning electron microscopy (SEM), and confocal microscopy (CM) are not suitable for on-line surface inspection of fine metallic wires. In the recent years, some optical techniques have been developed to be used for those tasks. However, they need a rigorous validation. In this work, we have used confocal microscopy to obtain the topography z(x,y) of wires with longitudinal defects, such as dielines. The topography has been used to predict the light scattered by the wire. These simulations have been compared with experimental results, showing a good agreement.
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© 2004 Elsevier B.V.
The authors thank Javier Alda for his valuable suggestions. This article is financed with DPI2001-1238 project.
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[1] E. Bernabéu et al. Surface structures on fine and ultra-fine wires, Editorial Complutense. ISBN: 84-7491-679-8. Madrid 2002.
[2] E. Bernabéu, et al., Classification of surface structures on fine and ultra-fine wires, Appl. Surf. Sci. 180 (2001) 191–199.
[3] S. Gómez, K. Hale, J. Burrows, B. Griffiths, Measurements of surface defects on optical components, Meas. Sci. Technol. 9 (1998) 607–616.
[4] L.M. Sánchez-Brea, J.A. Gómez-Pedrero, E. Bernabéu, Measurement of surface defects on thin steel wires by atomic force microscopy, Appl. Surf. Sci. 150 (14) (1999) 125–130.
[5] L.M. Sánchez-Brea, et al., Optical technique for the automatic detection and measurement of surface defects on thin metallic wires, Appl. Opt. 39 (4) (2000) 539–545.
[6] L.M. Sánchez-Brea, E. Bernabéu, Diffraction by cylinders illuminated in oblique, off-axis incidence, Optik 112 (4) (2001) 169–174.
[7] J.C. Martínez Antón, P. Siegmann, L.M. Sánchez Brea, E. Bernabéu, In-line detection and evaluation of surface defects on thin metallic wires SPIE, Opt. Meas. Syst. Ind. Inspec. II: App. Prod. Eng. 4399 (2001) 27–31.
[8] M. Born, E. Wolf, Principles of Optics, sixth ed., Pergamon Press, Oxford, 1991.