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In-line detection and evaluation of surface defects on thin metallic wires

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Martínez Antón, Juan Carlos and Siegmann, Philip and Sánchez Brea, Luis Miguel and Gómez Pedrero, José Antonio and Canabal Boutureira, Héctor and Bernabeu Martínez, Eusebio (2001) In-line detection and evaluation of surface defects on thin metallic wires. In Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering. Proceedings of The Society Of Photo-Optical Instrumentation Engineers (SPIE) (4399). The International Society for Optical Engineering (SPIE), pp. 27-34. ISBN 0-8194-4094-9

Official URL: http://dx.doi.org/10.1117/12.445586




Abstract

We have developed a prototype for in-line detection of surface defects in metallic wires, specially for scratches. A simple geometrical relationship between surface topography and conical reflection, permits to correlate the defects with intensity patterns in a simple way. The presented apparatus consists basically in a grating-divided laser beam incident on angular equidistant points. A CCD and an associated optics capture the information of the whole wire perimeter at once. Analytic rudiments are provided in agreement with the experimental results.


Item Type:Book Section
Additional Information:

© SPIE--The International Society for Optical Engineering.
Conference on Optical Measurement Systems for Industrial Inspection II (2ª. 2001. Múnich, Alemania).

Uncontrolled Keywords:Quality Control, Wire, Conical Reflection
Subjects:Sciences > Physics > Optics
ID Code:26795
Deposited On:25 Sep 2014 10:53
Last Modified:25 Sep 2014 10:53

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