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Reflection optical encoders as three-grating moiré systems

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Publication Date
2000-08-01
Authors
Crespo Vázquez, Daniel
Bernabeu Martínez, Eusebio
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The Optical Society Of America
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Abstract
Reflection optical encoders are studied as three-grating moiré systems. An analysis is made of the differences that may appear between it and the standard case in which an optical encoder is regarded as a two-grating system.
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© Optical Society of America. This research was supported by a project from the Comisión Interministerial de Ciencia y Tecnología (CICYT) under grant TAP 98-0862.
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1. K. Patorski, Handbook of the Moiré Fringe Technique (Elsevier, Amsterdam, The Netherlands, 1993), Chap. 5, pp. 99–139. 2. F. Talbot, “Facts relating to optical science: Number IV”, Philos. Mag. 9, 401–407 (1836). 3. A. Olszak, L. Wronkowski, “Analysis of the Fresnel field of a double diffraction system in the case of two amplitude diffraction gratings under partially coherent illumination”, Opt. Eng. 36, 2149–2157 (1997). 4. E. Keren, O. Kafri, “Diffraction effects in moiré deflectometry”, J. Opt. Soc. Am. A 2, 111–120 (1985). 5. K. Patorski, Moiré Metrology (Pergamon, New York, 1998). 6. G. N. Rassudova, “Moiré interference fringes in a system consisting of a transmission and a reflection diffraction grating. Part I”, Opt. Spectrosc. 22, 73–78 (1967); G. N. Rassudova, “Moiré interference fringes in a system consisting of a transmission and a reflection diffraction grating. Part II”, Opt. Spectrosc. 22, 255–258 (1967); G. N. Rassudova, “Moiré interference fringes in a system consisting of a transmission and a reflection diffraction grating. Part III”, Opt. Spectrosc. 22, 335–340 (1967). 7. L. Liu, X. Liu, L. Ye, “Joint Talbot effect and logic-operated moiré patterns”, J. Opt. Soc. Am. A 7, 970–976 (1990). 8. L. Wronkowski, “Diffraction model of an optoelectronic displacement measuring transducer”, Opt. Laser Technol. 27, 81–88 (1995). 9. L. Wronkowski, “Opto-electronic analog-impulse transducer accuracy from the point of view of diffraction phenomena”, in New Measurement Technology to Serve Mankind: Acta IMEKO 1985, Volume III. Measurement in Mechanics and Laser Metrology, G. Striker, T. Boromisza, T. Kemeny, eds. (Omikk-Technoinform, Budapest, Hungary, 1985), pp. 445–462.
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