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Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates

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Lucía Mulas, María Luisa and Sánchez Quesada, Francisco (2006) Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates. Physical Review B, 74 (2). ISSN 1098-0121

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Official URL: http://dx.doi.org/10.1103/PhysRevB.74.024507


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http://journals.aps.org/Publisher


Abstract

We have studied the electromagnetic parameters of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates with different angles tilted around the [100] and [001] axis. Changing a technological parameter such as the junction width permits change to the resonant frequency of the barrier cavity. This change in the resonance frequency allows one to determine a frequency dependent dispersion relation of the dielectric constant epsilon(omega). We have explored the proximity to a resonance in the dielectric response and analyzed its resonance frequency and damping constant. In terms of a RLC circuital equivalence additional information on the inductive response is presented as a comparative study of junctions fabricated on substrates with different bicrystalline misorientations.


Item Type:Article
Additional Information:

© The American Physical Society. This work was supported by the CICYT Grant No. BMF2001-1419, the ESF Network “Phi-shift,” the project DG236RIC “NDA” and the TRN “DeQUACS.”

Uncontrolled Keywords:Grain-Boundary Junctions, Electromagnetic Properties, He+ Irradiation, ICRN-Prodcuts, Superconductors, Interface, Transport.
Subjects:Sciences > Physics > Electricity
Sciences > Physics > Electronics
ID Code:27332
Deposited On:17 Nov 2014 13:28
Last Modified:10 Dec 2018 14:58

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