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Ellipsometric characterization of random and random-dimer GaAs-Alx-Ga_(1-x)As superlattices

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Bellani, V. and Parravicini, G. B. and Díez, E. and Domínguez-Adame Acosta, Francisco and Hey, R. (2002) Ellipsometric characterization of random and random-dimer GaAs-Alx-Ga_(1-x)As superlattices. Physical Review B, 66 (19). ISSN 1098-0121

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Official URL: http://dx.doi.org/10.1103/PhysRevB.66.193310


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Abstract

We studied the optical properties of ordered and intentionally disordered GaAs-AlxGa1-xAs superlattices, with and without dimer-type correlations in the disorder, by means of spectroscopic ellipsometry. The electronic structure of the superlattices has been calculated and compared with the experiments. The optical transitions in ordered, correlated, and uncorrelated disordered superlattices show specific features that we relate to their different electronic structures.


Item Type:Article
Additional Information:

© 2002 The American Physical Society.
We thank L. C. Andreani and B. Méndez for the careful reading of the manuscript and G. Guizzetti for enlightening discussions. V.B. was partially supported by MURST
(Project ‘Giovani Ricercato’). Work at Madrid was supported by DGI-MCyT (Project No. MAT2000-0734) and CAM (Project No. 07N/0075/20019.

Uncontrolled Keywords:Interband-Transitions, Localization, Absence
Subjects:Sciences > Physics > Materials
ID Code:27510
Deposited On:28 Nov 2014 09:57
Last Modified:28 Nov 2014 09:57

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