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Optical interference method to obtain thickness and refractive-indexes of a uniaxial medium

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Carreño Sánchez, Fernando and Martínez Antón, Juan Carlos and Bernabeu Martínez, Eusebio (1994) Optical interference method to obtain thickness and refractive-indexes of a uniaxial medium. Review of scientific instruments, 65 (8). pp. 2489-2493. ISSN 0034-6748

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Official URL: http://dx.doi.org/10.1063/1.1144707


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http://scitation.aip.org/Publisher


Abstract

Optical interference fringe measurements of the thickness of weakly absorbing media can be rapid, accurate, and nondestructive. When the refractive index n of the sample is known, it will give us the layer thickness d. If, however, n is unknown, at least two independent spectrophotometric measurements are needed to obtain both n and d. A statistically based scheme is proposed to analyze the interference pattern in order to determine the refractive index and the thickness of the sample. The absolute interference order is also determined with the proposed technique. The major approximation inherent in the method is that the layer must be weakly absorbing and nondispersive over the wavelength region of interest. The method is applied to determine the optical constants of a uniaxial medium with the optical axis parallel to the faces.


Item Type:Article
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© 1994 American Institute of Physics. The authors are specially indebted to J. J. Monzon for his useful discussion during the realization of this study, in addition to A. Larena and G. Pinto (E.T.S.S.I.) and J. Fort (T.P.E.) for their experimental support during the first stages of this study. They also acknowledge R. Yagiie for her manuscript review. This study has been done with the financial support of project MAT91-1389-CE.

Uncontrolled Keywords:Film thickness, Fringes, Region
Subjects:Sciences > Physics > Optics
ID Code:28001
Deposited On:29 Jan 2015 08:38
Last Modified:29 Jan 2015 08:38

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