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Modification of the LM124 single event transients by load resistors



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Franco Peláez, Francisco Javier y López Calle, Isabel y González Izquierdo, Jesús y Agapito Serrano, Juan Andrés (2010) Modification of the LM124 single event transients by load resistors. IEEE transactions on nuclear science, 57 (1). pp. 358-365. ISSN 0018-9499

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URL Oficial: http://dx.doi.org/10.1109/TNS.2009.2037894


The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients. SPICE simulations helped to understand the reasons of this behavior and showed that the distortion is related to the necessity of providing or absorbing current from the load resistor, which forces the amplifier to modify its operation point. Finally, load effects were successfully used to explain the distortion of single event transients in typical feed-back networks and the results were used to explain experimental data reported elsewhere.

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Palabras clave:SPICE; Operational amplifiers; Resistors; LM124 Operational amplifier; SPICE Simulation; Distortion; Feedback network; Laser test; Load effect; Load resistor; Single event transients; Absorption; Critical current; Laser noise; Operational amplifiers; Optical pulse generation; Pulse amplifiers; Resistors; SPICE; Shape; Testing; LM124; Laser irradiation; Load effects; Operational amplifier; Single event transients; Two-photon absorption
Materias:Ciencias > Física > Electrónica
Ciencias > Informática > Circuitos integrados
Código ID:28855
Depositado:27 Feb 2015 11:32
Última Modificación:10 Dic 2018 14:58

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