Universidad Complutense de Madrid
E-Prints Complutense

Single event effects on digital integrated circuits: origins and mitigation techniques

Impacto

Downloads

Downloads per month over past year



Velazco, Raoul and Franco Peláez, Francisco Javier (2007) Single event effects on digital integrated circuits: origins and mitigation techniques. In 2007 IEEE International Symposium on Industrial Electronics. IEEE, Piscataway, pp. 3322-3327. ISBN 978-1-4244-0755-2 (E-ISBN) ; 978-1-4244-0754-5 (Print ISBN)

[img]
Preview
PDF
119kB

Official URL: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4375148



Abstract

New generation electronic devices have become more and more sensitive to the effects of the natural radiation coming from the surrounding environment. These radiation sources are cosmic rays and radioactive impurities, able to corrupt the content of memory cells or to induce transient pulses in combinational logic. The growing sensitivity seems to be related to two main factors: the lower and lower charge needed to define the logic levels in advanced devices and the increasing number of basic components inside the modern integrated circuits. In this paper, are described state-of-art techniques to mitigate these effects as well as typical tests to verify the radiation-tolerance of the devices and/or systems.


Item Type:Book Section
Additional Information:

© 2007 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
IEEE International Symposium on Industrial Electronics (2007. Vigo)

Uncontrolled Keywords:Digital integrated circuits; Radiation hardening (electronics); Combinational logic; Cosmic rays; Digital integrated circuits; Electronic devices; Induce transient pulses; Memory cells; Radiation sources; Radioactive impurities; Single event effects; Circuit testing; Cosmic rays; Digital integrated circuits; Failure analysis;Impurities;Laboratories;Logic circuits;Logic devices;Single event upset;System testing
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Radioactivity
ID Code:28903
Deposited On:03 Mar 2015 13:31
Last Modified:10 Dec 2018 14:58

Origin of downloads

Repository Staff Only: item control page