Publication: Defining a strategy to perform life-tests with analog devices
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Publication Date
2011-09-19
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Palomar Trives, Carlos
Liu, Shih Fu
López Calle, Isabel
Maestro de la Cuerda, Juan Antonio
Agapito Serrano, Juan Andrés
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IEEE-Inst Electrical Electronics Engineers Inc
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Abstract
Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having enough data allowing statistical conclusions and, usually, single event transients are captured by means of oscilloscopes. In this paper, we propose a strategy to carry out life tests in analog voltage comparators by means of digital programmable device that can detect anomalous pulses in the voltage comparator. Besides, the idea on which this kind of tests relies can be extended to be used with other families of analog devices, such as operational amplifiers, voltage references, etc.
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©IEEE ©2012 Elsevier B.V
ISSN : 0379-6566
European Conference on Radiation and its Effects on Components and Systems (RADECS. 2011) (12. 2011. Sevilla, España)
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