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Defining a strategy to perform life-tests with analog devices

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Franco Peláez, Francisco Javier and Palomar Trives, Carlos and Liu, Shih Fu and López Calle, Isabel and Maestro de la Cuerda, Juan Antonio and Agapito Serrano, Juan Andrés (2011) Defining a strategy to perform life-tests with analog devices. In Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS 2011. European Space Agency -Publications- Esa Sp . IEEE-Inst Electrical Electronics Engineers Inc, pp. 92-98. ISBN 978-1-4577-0585-4

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Official URL: http://dx.doi.org/10.1109/RADECS.2011.6131375


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Abstract

Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having enough data allowing statistical conclusions and, usually, single event transients are captured by means of oscilloscopes. In this paper, we propose a strategy to carry out life tests in analog voltage comparators by means of digital programmable device that can detect anomalous pulses in the voltage comparator. Besides, the idea on which this kind of tests relies can be extended to be used with other families of analog devices, such as operational amplifiers, voltage references, etc.


Item Type:Book Section
Additional Information:

©IEEE ©2012 Elsevier B.V
ISSN : 0379-6566

European Conference on Radiation and its Effects on Components and Systems (RADECS. 2011) (12. 2011. Sevilla, España)

Uncontrolled Keywords:Comparators (circuits); Integrated circuit testing; Life testing; Rradiation hardening (electronics); Statistical analysis; Analog voltage comparators; Digital programmable device; Discrete analog devices; Integrated circuits; Memory elements; Natural radiation influence; Operational amplifiers; Scarce life tests; Single event transients; Statistical conclusions; Voltage references; Logic gates; Random access memory; Analog devices; Field tests; Life tests; Voltage comparator
Subjects:Sciences > Physics > Electronics
ID Code:28935
Deposited On:12 Mar 2015 19:31
Last Modified:10 Dec 2018 14:58

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