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Two-photon absorption (TPA) backside pulsed laser tests in the LM324

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López Calle, Isabel and Franco Peláez, Francisco Javier and González Izquierdo, Jesús and Agapito Serrano, Juan Andrés (2009) Two-photon absorption (TPA) backside pulsed laser tests in the LM324. In European Conference on Radiation and its Effects on Components and Systems (RADECS), 2009. European Space Agency -Publications- Esa Sp . IEEE-Inst Electrical Electronics Engineers Inc, pp. 138-143. ISBN 978-1-4577-0492-5

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Official URL: http://dx.doi.org/10.1109/RADECS.2009.5994568


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Abstract

Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.

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Item Type:Book Section
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© IEEE.© 2011 Elsevier B.V.
ISSN : 0379-6566
E-ISBN : 978-1-4577-0493-2

European Conference on Radiation and its Effects on Components and Systems (RADECS 2009) (10. 2009. Bruges, Bélgica)

Uncontrolled Keywords:Absorption; Operational amplifiers; Two-photon processes; LM324; TPA backside pulsed laser test; UCM; Operational amplifier; Surface XY scan; Two-photon absorption backside pulsed laser test; Absorption; Lasers; Measurement by laser beam; Photonics; Radiation effects; Transient analysis; Transistors; LM324; Laser; Operational Amplifiers; Single Event Transients; Two-Photon Tests
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Optics
Sciences > Computer science
Sciences > Computer science > Integrated circuits
ID Code:28948
Deposited On:12 Mar 2015 18:52
Last Modified:10 Dec 2018 14:58

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