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Two-photon absorption (TPA) backside pulsed laser tests in the LM324

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López Calle, Isabel y Franco Peláez, Francisco Javier y González Izquierdo, Jesús y Agapito Serrano, Juan Andrés (2009) Two-photon absorption (TPA) backside pulsed laser tests in the LM324. In European Conference on Radiation and its Effects on Components and Systems (RADECS), 2009. European Space Agency -Publications- Esa Sp . IEEE-Inst Electrical Electronics Engineers Inc, pp. 138-143. ISBN 978-1-4577-0492-5

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URL Oficial: http://dx.doi.org/10.1109/RADECS.2009.5994568


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Resumen

Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.

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Tipo de documento:Sección de libro
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© IEEE.© 2011 Elsevier B.V.
ISSN : 0379-6566
E-ISBN : 978-1-4577-0493-2

European Conference on Radiation and its Effects on Components and Systems (RADECS 2009) (10. 2009. Bruges, Bélgica)

Palabras clave:Absorption; Operational amplifiers; Two-photon processes; LM324; TPA backside pulsed laser test; UCM; Operational amplifier; Surface XY scan; Two-photon absorption backside pulsed laser test; Absorption; Lasers; Measurement by laser beam; Photonics; Radiation effects; Transient analysis; Transistors; LM324; Laser; Operational Amplifiers; Single Event Transients; Two-Photon Tests
Materias:Ciencias > Física > Electrónica
Ciencias > Física > Optica
Ciencias > Informática
Ciencias > Informática > Circuitos integrados
Código ID:28948
Depositado:12 Mar 2015 18:52
Última Modificación:10 Dic 2018 14:58

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