Publication: Two-photon absorption (TPA) backside pulsed laser tests in the LM324
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2009-09-14
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IEEE-Inst Electrical Electronics Engineers Inc
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Abstract
Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.
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© IEEE.© 2011 Elsevier B.V.
ISSN : 0379-6566
E-ISBN : 978-1-4577-0493-2
European Conference on Radiation and its Effects on Components and Systems (RADECS 2009) (10. 2009. Bruges, Bélgica)
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S. Buchner, J. J. Howard, C. Poivey, D. McMorrow and R. Pease, "Pulsed-laser testing methodology for single event transients in linear devices", IEEE Transactions on Nuclear Science, Vol. 51, pp. 3716-3722, Dec. 2004.
Sternberg, A. L.; Massengill, L. W.; Buchner, S.; Pease, R. L.; Boul-ghassoul, Y.; Savage, M. W.; McMorrow, D. and Weller, R. A. "The role of parasitic elements in the single-event transient response of linear circuits", IEEE Transactions on Nuclear Science, Vol. 49, pp. 3115-3120, Dec. 2002.
Buchner, S.; McMorrow, D.; Poivey, C.; Howard, J. J.; Boulghassoul, Y.; Massengill, L. W.; Pease, R. & Savage, M., "Comparison of singleevent transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions", IEEE Transactions on Nuclear Science, Vol. 51, pp. 2776-2781, Dec. 2004.
McMorrow, D.; Lotshaw, W. T.; Melinger, J. S.; Buchner, S.; Boulghas-soul, Y.; Massengill, L. W. & Pease, R. L., "Three-dimensional mapping of single-event effects using two photon absorption", IEEE Transactions on Nuclear Science, Vol. 50, pp. 2199-2207, Dec. 2003.
McMorrow, D.; Lotshaw, W. T.; Melinger, J. S.; Buchner, S. & Pease, R. L., "Subbandgap laser-induced single event effects: carrier generation via two-photon absorption", IEEE Transactions on Nuclear Science, Vol. 49, pp. 3002-3008, Dec. 2002.
A. Akkerman and J. Barack, "Ion-track structure and its effects in small size volumes of silicon" IEEE Transactions on Nuclear Science, vol.49, pp.3022-3031, December 2002.
R. Pease, "Modeling single event transients in bipolar linear circuits, "Nuclear Science, IEEE Transactions on Nuclear Science, vol. 55, no. 4, pp. 1879-1890, Aug. 2008.
Savage, M.W.; Turflinger, T.; Titus, J.L.; Barsun, H.F.; Sternberg, A.; Boulghassoul, Y.; Massengill, L.W., "Variations in SET pulse shapes in the LM124A and LM111," Radiation Effects Data Workshop, pp. 75-81, 2002.
D. Lewis et al., "Backside laser testing of ICs for SET sensitivity evaluation", IEEE Transactions on Nuclear Science, vol. 48, no. 6, p.2193, Dec. 2001