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Using optimization techniques to characterize irradiated CMOS analog switches



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Zong, Yi and Franco Peláez, Francisco Javier and Agapito Serrano, Juan Andrés (2004) Using optimization techniques to characterize irradiated CMOS analog switches. In Radiation Effects on Components and Systems: RADECS, 2004: Proceedings: 5th RADESC Workshop, Madrid (Spain), 22-24 September 2004. INTA, Madrid, pp. 279-285. ISBN 84-930056-1-4




The use of mathematical optimization techniques allows estimating the degradation of the internal components of irradiated CMOS analog switches from their nonlinear resistance and the value of leakage currents at different power supplies voltages.

Item Type:Book Section
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Radiation Effects on Components and Systems (RADECS 2004) (5. 2004. Madrid)

This work was supported by the cooperation agreement K746/LHC between CERN & UCM, by the Spanish Research Agency CICYT (FPA2002-00912) and partially supported by Instituto Tecnológico e Nuclear of Portugal.

Uncontrolled Keywords:Analog switches, COTS, Neutron effects, Optimization, TID effects.
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Radioactivity
ID Code:29022
Deposited On:20 Mar 2015 17:13
Last Modified:10 Dec 2018 14:58

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