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Evolution of lowest supply voltage and hysteresis phenomena in irradiated analog CMOS switches

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Franco Peláez, Francisco Javier and Zong, Yi and Agapito Serrano, Juan Andrés and Casas-Cubillos, Juan and Rodríguez-Ruiz, Miguel Ángel (2004) Evolution of lowest supply voltage and hysteresis phenomena in irradiated analog CMOS switches. In 2004 IEEE Radiation Effects Data Workshop : ( workshop record ). IEEE-Inst Electrical Electronics Engineers Inc, New York, pp. 91-95. ISBN 0-7803-8697-3

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Official URL: http://dx.doi.org/10.1109/REDW.2004.1352912



Abstract

Radiation tests on CMOS analog switches were carried out in order to select the most tolerant device for future use in the cryogenic system of the CERN large hadron collider. After irradiation, the devices showed some interesting changes related to the power supplies: an increase in the lowest supply voltage capable of biasing correctly the devices; some devices cannot work with TTL logic levels. In addition, hysteresis phenomena appear.

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Item Type:Book Section
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© IEEE

IEEE Radiation Effects Data Workshop (2004, Atlanta).

This work was supported by the cooperation agreement K476/LHC between CERN and UCM, by the Spanish Research Agency CICYT (FPA2002-00912) and partially supported by ITN.

Uncontrolled Keywords:CMOS analogue integrated circuits; Field effect transistor switches; Gamma-ray effects; Hysteresis; Neutron effects;LHC;TID tests;TTL logic levels; Device biasing voltage; Hysteresis phenomena; Irradiated analog CMOS switches; Large hadron collider; Lowest supply voltage phenomena; Neutron fluence; Radiation tests; Switching threshold voltage shift; Total gamma dose; Total ionizing dose; CMOS logic circuits; Cryogenics; Hysteresis; Large Hadron Collider; Logic devices; Neutrons; Pulse inverters; Switches; System testing; Voltage
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Radioactivity
ID Code:29103
Deposited On:17 Mar 2015 13:25
Last Modified:10 Dec 2018 14:58

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