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A portable low-cost SEU evaluation board for SRAMs

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Franco Peláez, Francisco Javier and Velazco, Raoul (2007) A portable low-cost SEU evaluation board for SRAMs. In 2007 Spanish Conference on Electron Devices, Proceedings. IEEE-Inst Electrical Electronics Engineers Inc, pp. 165-168. ISBN 1-4244-0868-7

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Official URL: http://dx.doi.org/10.1109/SCED.2007.384018


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http://ieeexplore.ieee.org/UNSPECIFIED


Abstract

This paper describes a field test system to evaluate the sensitivity of SRAMs to the natural radiation coming from the interaction of cosmic rays with the atmosphere. Unlike other experiments, this system is optimized to be portable and autonomous in order to allow making the development of the tests more flexible.

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©IEEE.

Spanish Conference on Electron Devices (6.2007.Madrid).

This work was supported by the NICRON Project (Fault-Tolerant Design and Verification for Safety-Critical Applications built from Advanced Integrated Circuits), in the frame of the ALFA (América Latina Formación Académica) cooperation agreement.

Uncontrolled Keywords:SRAM chips; Logic testing; Radiation effects; Sensitivity; SEU evaluation board; SRAM; Cosmic ray interaction; Field test system; Natural radiation effects; Sensitivity; Single event upset; Atmosphere; Cosmic rays; Field programmable gate arrays; Laboratories; Microprocessors; Neutrons; Performance evaluation; Random access memory; Single event upset; System testing; Cosmic rays; SRAMs; Single event effects; Soft error rate
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Radioactivity
Sciences > Computer science > Integrated circuits
ID Code:29153
Deposited On:11 Mar 2015 17:48
Last Modified:10 Dec 2018 14:58

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