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Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices



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López Calle, Isabel y Franco Peláez, Francisco Javier y Agapito Serrano, Juan Andrés y González Izquierdo, Jesús (2011) Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices. In 2011 Spanish Conference on Electron Devices (CDE 2011). Spanish Conference on Electron Devices . IEEE-Inst Electrical Electronics Engineers Inc, pp. 1-4. ISBN 978-1-4244-7863-7

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URL Oficial: http://dx.doi.org/10.1109/SCED.2011.5744202

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One of the main phenomena that commit the reliability of analog electronic systems working in the outer space is the presence of energetic ions that produce spurious transients after crossing the device. These pulses are transmitted to the network loading the device and can eventually lead to dangerous situations as it has been observed in some spatial missions. This paper shows how the value of the resistor loading the device can affect the shape of the transients.

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Tipo de documento:Sección de libro
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Spanish Conference on Electron Devices (CDE) (8.2011. Palma de Mallorca, España)

Palabras clave:Analogue circuits; Circuit reliability; Resistors; Transients; Analog electronic devices; Analog electronic systems reliability; Energetic ions; Load resistor; Network loading; Single-event transients; Spatial missions; Spurious transients; Worst-case parameter; Operational amplifiers; Resistors; SPICE; Shape; Transient analysis; Transistors; Voltage measurement; Analog devices; Bipolar technology; Laser tests; Single event transients; System reliability; Two-photon absorption
Materias:Ciencias > Física > Electrónica
Ciencias > Física > Optica
Ciencias > Informática > Circuitos integrados
Código ID:29155
Depositado:11 Mar 2015 19:03
Última Modificación:10 Dic 2018 14:58

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