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Laser induced single events in SRAMs

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Palomar Trives, Carlos and López Calle, Isabel and Franco Peláez, Francisco Javier and Agapito Serrano, Juan Andrés and González Izquierdo, Jesús (2013) Laser induced single events in SRAMs. In Proceedings of the 2013 Spanish Conference on Electron Devices (CDE 2013). Spanish Conference on Electron Devices . IEEE-Inst Electrical Electronics Engineers Inc, pp. 253-256. ISBN 978-1-4673-4666-5

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Official URL: http://dx.doi.org/10.1109/CDE.2013.6481390


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Abstract

This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur.


Item Type:Book Section
Additional Information:

©IEEE.
E-ISBN : 978-1-4673-4667-2.

Spanish Conference on Electron Devices (CDE)(9. 2013. Valladolid, España)

Uncontrolled Keywords:SRAM chips; Laser beam effects; Radiation hardening (electronics); SRAM;error emulation; Laser induced single events; Pulsed laser; Semiconductor memory; Sensitivity map; Space radiation; Microprocessors; Performance evaluation; Polymers; Radiation effects; Semiconductor lasers; Sensitivity; Laser; MCU; SEU; Errors; Memory; Sensitivity map
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Optics
Sciences > Computer science > Integrated circuits
ID Code:29179
Deposited On:11 Mar 2015 18:12
Last Modified:10 Dec 2018 14:58

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