Publication:
Laser induced single events in SRAMs

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eprintsucm29179.pdf (1.02 MB)
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http://dx.doi.org/10.1109/CDE.2013.6481390
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Publication Date
2013-02
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IEEE-Inst Electrical Electronics Engineers Inc
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Abstract
This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur.
Description
©IEEE. E-ISBN : 978-1-4673-4667-2. Spanish Conference on Electron Devices (CDE)(9. 2013. Valladolid, España)
UCM subjects
Electrónica (Física) , Óptica (Física) , Circuitos integrados
Unesco subjects
2209.19 Óptica Física , 2203.07 Circuitos Integrados
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Citation
[1] I. Lopez-Calle, F. J. Franco, J. G. Izquierdo, & J. A. Agapito, "LASER System for Space Environment Emulation", IEEE Spanish Conference on Electron Devices, Palma de Mallorca (Spain), pp. 1-4, Feb 2011. [2] F. J. Franco, I. Lopez-Calle, J. G. Izquierdo, and J. A. Agapito, "Modification of the LM124 single event transients by load resistors," IEEE Transactions on Nuclear Science, vol. 57, no. 1, pp. 358-365, Feb. 2010. [3] F. Miller, "Interest of laser test facility for the assessment of natural radiation environment effects on integrated circuits based systems", 7th RADECS, pp. 199-209, 2003.
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https://hdl.handle.net/20.500.14352/35721
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