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Radiation effects on CMOS R/2R ladder digital-to-analog converters

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2003-09-15
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The behaviour of CMOS R/2R ladder D/A converters when they are irradiated simultaneously with gamma and neutron radiation is described. The converters suffer an increase of the offset error and a reduction of the linearity because of the malfunction of the internal CMOS switches and the appearance of leakage currents. The effective inputs become "1" whatever the actual input is. No evidence of neutron damage was found.
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©ESA ©IEEE ISSN: 0379-6566 Radiation Effects on Components and Systems (RADECS 2003) (7. 2003. Noordwijk, Holanda) This work was supported by the cooperation agreement K476LHC between CERN & UCM, by the Spanish research agency ClCYT (FPA2002- 009l2), partially supported by ITN and by the private foundation "Migel Casado San José"
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[1] The LHC Study Group, “The Large Hadron Collider Conceptual Design,” Tech. Rep., 1995. [2] D. A. Johns and K. Martin, Analog Integrated Circuit Design. John Wiley, 1997. [3] “Analog Devices Inc.” http://www.analog.com. [4] “Maxim Integrated Products,” http://maxim-ic.com. [5] W. K. Chien, The VLSI Handbook. CRC Press, 2000. [6] M. Alexander, “Understanding and preventing latch-up in CMOS DACs,” App. Note AN-109, Analog Devices, [Online] Available: http://www.analog.com/media/en/technical-documentation/application-notes/20809090AN109.pdf. [7] J. Lozano, F. J. Franco, J. P. Santos, and J. A. Agapito, “Instrumentation system for test of electronic components subjected to neutron radiation,” in Proceedings of the SAAEI 2002, Sep. 2002. [8] J. R. Srour and J. M. McGarrity, “Radiation effects on microelectronics in space,” Proceedings of the IEEE, vol. 76, no. 11, pp. 1443–1469, Nov 1988. [9] S. E. Kerns, B. D. Shafer, N. van Vonno, and F. E. Barber, “The design of radiation-hardened ICs for space: a compendium of approaches,” Proceedings of the IEEE, vol. 76, no. 11, pp. 1470–1509, Nov 1988. [10] S. M. Sze, Physics of Semiconductor Devices. USA: John Wiley & Sons, Inc., 1981. [11] O. Flament, C. Chabrerie, V. Ferlet-Cavrois, and J. L. Leray, “A methodology to study lateral parasitic transistors in CMOS technologies,” IEEE Transaction on Nuclear Science, vol. 45, no. 3, pp. 1385–1389, Jun 1998. [12] H. Kamimura, M. Sakagami, S. Uchida, and M. Kato, “Total-dose hardness assurance-testing for CMOS devices in space environment,” in Proceedings of the Annual IEEE Reliability and Maintainability Symposium, Jan 1992, pp. 202–209. [13] G. C. Messenger, “A summary review of displacement damage from high energy radiation in silicon semiconductors and semiconductor devices,” IEEE Transactions on Nuclear Science, vol. 39, no. 3, pp. 468–473, Jun 1992. [14] G. C. Messenger and M. S. Ash, The Effects of Radiation on Electronic Systems, 2nd ed. New York: Van Nostrand Reinhold, 1992. [15] P. Horowitz and W. Hill, The Art of Electronics, 2nd ed. USA: Cambridge University Press, 1989. [16] M. S. Tyagi, Introduction fo Semiconductor Materials and Devices. Singapore: John Wiley & Sons, Inc., 1991. [17] P. C. Maulik, “Analysis of leakage current induced nonlinearity in resistor-ladder based data converters,” IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, vol. 47, no. 2, pp. 136–137, Feb 2000. [18] A. Sharma, K. Sahu, and S. Brashears, “Total ionizing dose (TID) evaluation results of low dose rate testing for NASA programs,” in IEEE Radiation Effects Data Workshop, 1996., Jul 1996, pp. 13–18. [19] M. O’Bryan, K. LaBel, R. Reed, J. Howard, R. Ladbury, J. Barth, S. Kniffin, C. Seidleck, P. Marshall, C. Marshall, H. Kim, D. Hawkins, A. Sanders, M. Carts, J. Forney, D. Roth, J. Kinnison, E. Nhan, and K. Sahu, “Radiation damage and single event effect results for candidate spacecraft electronics,” in IEEE Radiation Effects Data Workshop, 2000, 2000, pp. 106–122.