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Electron-electron interaction and weak localization effects in badly metallic SrRuO_(3)

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López de la Torre, M. A. and Sefrioui, Zouhair and Arias Serna, Diego and Varela del Arco, María and Villegas, J. E. and Ballesteros, C. and León Yebra, Carlos (2001) Electron-electron interaction and weak localization effects in badly metallic SrRuO_(3). Physical review B, 63 (5). ISSN 0163-1829

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Official URL: http://dx.doi.org/10.1103/PhysRevB.63.052403


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http://journals.aps.org/Publisher


Abstract

We report on the effect of light ion irradiation on the low-temperature electrical resistivity of ferromagnetic SrRuO_(3) thin films. Fresh samples displayed a ferromagnetic transition at T_(c)̴ 160 K, good metallic behavior (ρ(300 K)~400μΩcm, dρ/dT>0) at room temperature, and the low-temperature upturn in the electrical resistivity commonly found in SrRuO_(3). Badly metallic films, displaying high values of the electrical resistivity (O(1000μΩcm)) and incipient nonmetallic behavior (dρ/dT<0) at low temperature, were obtained by He+ irradiation. For high enough irradiation doses, these samples did not show magnetic order down to the base temperature of our experiments. The temperature dependence of the electrical conductivity of virgin and irradiated samples is discussed in terms of a weak localization contribution plus a large electron-electron interaction term. The magnitude of the e^(-)-e^(-) contribution reflects the enhancement of strong electron correlations in SrRuO_(3) due to disorder.


Item Type:Article
Additional Information:

© 2001 The American Physical Society. This work was supported by Comisión Asesora de la Investigación Científica y Técnica through Projects Nos. MAT94-0604C0102 and Acción Especial MAT 17/95. Z.S. acknowledges financial support from Agencia Española de Cooperación Internacional (AECI).

Uncontrolled Keywords:Itinerant ferromagnet SrRuO_(3); Insulator-transition; Thin-films; Conductivity; Transport; Resistivity; Saturation.
Subjects:Sciences > Physics > Electricity
Sciences > Physics > Electronics
ID Code:31136
Deposited On:29 Jun 2015 11:50
Last Modified:10 Dec 2018 14:58

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