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Topographic optical profilometry of steep slope micro-optical transparent surfaces

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Martínez Antón, Juan Carlos and Alonso Fernández, José and Gómez Pedrero, José Antonio (2015) Topographic optical profilometry of steep slope micro-optical transparent surfaces. Optics express, 23 (7). pp. 9494-9507. ISSN 1094-4087

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Official URL: https://doi.org/10.1364/OE.23.009494




Abstract

Optical profilometers based on light reflection may fail at surfaces presenting steep slopes and highly curved features. Missed light, interference and diffraction at steps, peaks and valleys are some of the reasons. Consequently, blind areas or profile artifacts may be observed when using common reflection micro-optical profilometers (confocal, scanning interferometers, etc…). The Topographic Optical Profilometry by Absorption in Fluids (TOPAF) essentially avoids these limitations. In this technique an absorbing fluid fills the gap between a reference surface and the surface to profile. By comparing transmission images at two different spectral bands we obtain a reliable topographic map of the surface. In this contribution we develop a model to obtain the profile under micro-optical observation, where high numerical aperture (NA) objectives are mandatory. We present several analytical and experimental results, validating the technique’s capabilities for profiling steep slopes and highly curved micro-optical surfaces with nanometric height resolution.


Item Type:Article
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En Open Access en la web del editor.

Uncontrolled Keywords:Instrumentation ; Measurement ; Metrology ; Optical inspection ; Surface measurements, Micro-optical devices ; Optical profilometry
Subjects:Sciences > Physics > Optics
Medical sciences > Optics > Optical materials
ID Code:39357
Deposited On:17 Oct 2016 14:42
Last Modified:17 Oct 2016 15:24

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