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Ellipsometric characterization of Bi and Al2O3 coatings for plasmon excitation in an optical fiber sensor

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Rodriguez Schwendtner, Eva María and Álvarez Herrero, Alberto and Mariscal Jiménez, Antonio and Serna Galán, Rosalía and González Cano, Agustín and Navarrete Fernández, María Cruz and Díaz Herrera, Natalia (2019) Ellipsometric characterization of Bi and Al2O3 coatings for plasmon excitation in an optical fiber sensor. Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 37 (6). 062914. ISSN 2166-2746

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Official URL: http://dx.doi.org/10.1116/1.5121590



Abstract

The authors present the results of the ellipsometric characterization of thin layers of bismuth and aluminum oxide deposited over the waist of a tapered optical fiber by pulsed laser deposition. The characteristics of the deposits are studied by spectroscopic ellipsometry. From the effective thicknesses determined by the ellipsometric characterization, it is shown by simulations that surface plasmon resonances (SPRs) can occur in the fiber device, and it is demonstrated experimentally. These results show the feasibility of employing bismuth as a plasmonic material in SPR fiber sensors based on doubly-deposited uniform-waist tapered optical fibers, which show excellent performance and versatility.


Item Type:Article
Uncontrolled Keywords:Surface plasmon resonance; Resonance sensor; Optical fibers; Spectroscopic ellipsometry; Pulsed laser deposition
Subjects:Sciences > Physics > Materials
Sciences > Physics > Optics
Sciences > Physics > Particles
ID Code:58574
Deposited On:22 Jan 2020 11:00
Last Modified:22 Jan 2020 15:40

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