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Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests

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Franco Peláez, Francisco Javier and Clemente Barreira, Juan Antonio and Korkian, Golnaz and Fabero Jiménez, Juan Carlos and Mecha López, Hortensia and Velazco, Raoul (2020) Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests. IEEE Transactions on Nuclear Science . ISSN 0018-9499 (In Press)

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Official URL: https://ieeexplore.ieee.org/document/9020111



Abstract

In radiation tests on SRAMs or FPGAs, two or more independent bitflips can be misled with a multiple event if they accidentally occur in neighbor cells. In the past, different tests such as the ``birthday statistics'' have been proposed to estimate the accuracy of the experimental results. In this paper, simple formulae are proposed to determine the expected number of false 2-bit and 3-bit MCUs from the number of bitflips, memory size and the method used to search multiple events. These expressions are validated using Monte Carlo simulations and experimental data. Also, a technique is proposed to refine experimental data and thus partially removing possible false events. Finally, it is demonstrated that there is a physical limit to determine the cross section of memories with arbitrary accuracy from a single experiment.


Item Type:Article
Uncontrolled Keywords:Birtdhay Statistics, FPGA, SEU, SRAM
Subjects:Sciences > Physics > Electronics
Sciences > Physics > Radioactivity
Sciences > Computer science > Integrated circuits
Sciences > Computer science > Electronics
Sciences > Computer science > Electronics
ID Code:59495
Deposited On:17 Mar 2020 09:38
Last Modified:17 Mar 2020 09:38

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